OBTAINING ELECTRON ENERGY LOSS SPECTRA AND X-RAY EMISSION SPECTRA FREE OF INSTRUMENTAL ARTIFACTS

نویسندگان
چکیده

برای دانلود باید عضویت طلایی داشته باشید

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

منابع مشابه

Improving the energy resolution of X-ray and electron energy-loss spectra.

We discuss some practical problems of improving the resolution of X-ray and electron spectra. Iterative Bayesian methods promise greater resolution enhancement than Fourier techniques but they also give rise to spectral artifacts. Satellite peaks are generated adjacent to strong peaks in the original spectrum and oscillatory artifacts become prominent after a large number of iterations, particu...

متن کامل

Obtaining an Electron Energy - Loss Spectra Fingerprint for the Χ and Κ Phases of Aluminum Oxide

OBTAINING AN ELECTRON ENERGY-LOSS SPECTRA FINGERPRINT FOR THE χ AND κ PHASES OF ALUMINUM OXIDE Michael Tanner Department of Physics and Astronomy Bachelor of Science The crystal structure of Al2O3 is found naturally in at least seven different atomic arrangements or phases. By heating gibbsite, an aluminum hydroxide, to different temperatures, the χ, κ, and α phases were obtained. The phase of ...

متن کامل

simulation and comparison of radiology x-ray spectra

monte carlo method is a very accurate method to optimize medical diagnostic radiology spectra and simulation of radiation transportation. using mcnp code, radiology and mammography attenuated x-rayspectraweresimulated.the ipem report number 78 was used as a reference to compare with the geant4 and mcnp simulations because of its popularity and wide availability. the results of geant4 in 40kev s...

متن کامل

Compton scattering artifacts in electron excited X-ray spectra measured with a silicon drift detector.

Artifacts are the nemesis of trace element analysis in electron-excited energy dispersive X-ray spectrometry. Peaks that result from nonideal behavior in the detector or sample can fool even an experienced microanalyst into believing that they have trace amounts of an element that is not present. Many artifacts, such as the Si escape peak, absorption edges, and coincidence peaks, can be traced ...

متن کامل

Signatures of synchrotron emission and of electron acceleration in the X - ray spectra of Mrk 421

Context. BL Lac objects undergo strong flux variations involving considerable changes in their spectral shapes. We specifically investigate the X-ray spectral evolution of Mrk 421 over a time span of about nine years. Aims. We aim at statistically describing and physically understanding the large spectral changes in X rays observed in Mrk 421 over this time span. Methods. We perform a homogeneo...

متن کامل

ذخیره در منابع من


  با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید

ژورنال

عنوان ژورنال: Le Journal de Physique Colloques

سال: 1984

ISSN: 0449-1947

DOI: 10.1051/jphyscol:1984299